2007
Rumpf, Raymond C; Tal, Amir; Kuebler, Stephen M
Rigorous electromagnetic analysis of volumetrically complex media using the slice absorption method Journal Article
In: JOSA A, vol. 24, no. 10, pp. 3123-3134, 2007, ISSN: 1520-8532.
Abstract | Links | BibTeX | Tags: electromagnetic analysis, Slice Absorption Method (SAM), Slice Absorption Method (SAM)
@article{RN39,
title = {Rigorous electromagnetic analysis of volumetrically complex media using the slice absorption method},
author = {Raymond C Rumpf and Amir Tal and Stephen M Kuebler},
url = {https://www.osapublishing.org/josaa/abstract.cfm?uri=josaa-24-10-3123},
doi = {https://doi.org/10.1364/JOSAA.24.003123},
issn = {1520-8532},
year = {2007},
date = {2007-01-01},
urldate = {2007-01-01},
journal = {JOSA A},
volume = {24},
number = {10},
pages = {3123-3134},
abstract = {There is tremendous demand for numerical methods to perform rigorous analysis of devices that are both large scale and complex throughout their volume. This can arise when devices must be considered with realistic geometry or when they contain artificial materials such as photonic crystals, left-handed materials, nanoparticles, or other metamaterials. The slice absorption method (SAM) was developed to address this need. The method is fully numerical and able to break large problems down into small pieces, or slices, using matrix division or Gaussian elimination instead of eigensystem computations and scattering matrix manipulations. In these regards, the SAM is an attractive alternative to popular techniques like the finite-difference time domain method, rigorous coupled-wave analysis, and the transfer matrix method. To demonstrate the utility of the SAM and benchmark its accuracy, reflection was simulated for a photonic crystal fabricated in SU-8 by multiphoton direct laser writing. Realistic geometry was incorporated into the model by simulating the microfabrication process, which yielded simulation results that matched experimental measurements remarkably well.},
keywords = {electromagnetic analysis, Slice Absorption Method (SAM), Slice Absorption Method (SAM)},
pubstate = {published},
tppubtype = {article}
}
There is tremendous demand for numerical methods to perform rigorous analysis of devices that are both large scale and complex throughout their volume. This can arise when devices must be considered with realistic geometry or when they contain artificial materials such as photonic crystals, left-handed materials, nanoparticles, or other metamaterials. The slice absorption method (SAM) was developed to address this need. The method is fully numerical and able to break large problems down into small pieces, or slices, using matrix division or Gaussian elimination instead of eigensystem computations and scattering matrix manipulations. In these regards, the SAM is an attractive alternative to popular techniques like the finite-difference time domain method, rigorous coupled-wave analysis, and the transfer matrix method. To demonstrate the utility of the SAM and benchmark its accuracy, reflection was simulated for a photonic crystal fabricated in SU-8 by multiphoton direct laser writing. Realistic geometry was incorporated into the model by simulating the microfabrication process, which yielded simulation results that matched experimental measurements remarkably well.